About Scanning
Electron Microscope
The capacity of an optical microscope is limited by the
wavelength of the light used to see the object. When it comes to studying the
structure and arrangement of atoms and molecules, optical microscopes fall
short because their resolution is limited by the wavelength of light. In 1931,
Max Knoll and Ernst Ruska invented the electron microscope. They used electrons
to view objects through a microscope instead of optical light. As electrons
have wavelengths that can be measured in angstroms, they are able to overcome
the barriers of optical microscopes, thus proving highly beneficial for
researchers viewing samples at the nanoscale.
SEMs produce images by examining the electrons scattered by the electron beam on the surface of a specimen. They are extensively used for R&D to analyze the surface of specimens. SEMs produce images by scattering electrons from the specimen surface, thus providing three-dimensional images. This is one of the distinguishing factors compared to TEMs and is an advantage for end-users. With 3D images, the user can get more information about the shape and features of the specimen, which are in many cases more important than the higher magnification provided by TEMs.
SEMs produce images by examining the electrons scattered by the electron beam on the surface of a specimen. They are extensively used for R&D to analyze the surface of specimens. SEMs produce images by scattering electrons from the specimen surface, thus providing three-dimensional images. This is one of the distinguishing factors compared to TEMs and is an advantage for end-users. With 3D images, the user can get more information about the shape and features of the specimen, which are in many cases more important than the higher magnification provided by TEMs.
Technavio’s analysts forecast the global SEM market to grow
at a CAGR of 7.65% during the period 2016-2020.
Covered in this
report
The report covers the present scenario and the growth prospects of the global SEM market for 2016-2020. To calculate the market size, the report considers the sales of SEMs by each vendor across all regions. The ASP of SEMs is calculated by analyzing the selling prices of SEMs to end-users, which are then used to calculate the market size.
The report covers the present scenario and the growth prospects of the global SEM market for 2016-2020. To calculate the market size, the report considers the sales of SEMs by each vendor across all regions. The ASP of SEMs is calculated by analyzing the selling prices of SEMs to end-users, which are then used to calculate the market size.
The market is divided into the following segments based on
geography:
• Americas
• APAC
• EMEA
• Americas
• APAC
• EMEA
Technavio's report, Global Scanning Electron Microscope
Market 2016-2020, has been prepared based on an in-depth market analysis with
inputs from industry experts. The report covers the market landscape and its
growth prospects over the coming years. The report also includes a discussion
of the key vendors operating in this market.
Complete report details @ https://www.wiseguyreports.com/reports/417240/global-scanning-electron-microscope-market-2016-2020
Key vendors
• Advantest Corp.
• Agilent Technologies
• B-nano Ltd.
• Carl Zeiss AG
• Delong America Inc.
• FEI Co.
• Hitachi High-Technologies Corp.
• JEOL Ltd.
• Pemtron Corp.
• Phenom-World BV
• Tescan
• Advantest Corp.
• Agilent Technologies
• B-nano Ltd.
• Carl Zeiss AG
• Delong America Inc.
• FEI Co.
• Hitachi High-Technologies Corp.
• JEOL Ltd.
• Pemtron Corp.
• Phenom-World BV
• Tescan
Other prominent
vendors
• Advantest
• B-nano
• Delong America
• Keysight Technologies
• Phenom-World
• Pemtron
• TESCAN
• Advantest
• B-nano
• Delong America
• Keysight Technologies
• Phenom-World
• Pemtron
• TESCAN
Market driver
• Root-cause failure analysis
• For a full, detailed list, view our report
• Root-cause failure analysis
• For a full, detailed list, view our report
Market challenge
• High product cost
• For a full, detailed list, view our report
• High product cost
• For a full, detailed list, view our report
Market trend
• Increased adoption in automobile sector
• For a full, detailed list, view our report
• Increased adoption in automobile sector
• For a full, detailed list, view our report
Key questions
answered in this report
• What will the market size be in 2020 and what will the growth rate be?
• What are the key market trends?
• What is driving this market?
• What are the challenges to market growth?
• Who are the key vendors in this market space?
• What are the market opportunities and threats faced by the key vendors?
• What are the strengths and weaknesses of the key vendors?
• What will the market size be in 2020 and what will the growth rate be?
• What are the key market trends?
• What is driving this market?
• What are the challenges to market growth?
• Who are the key vendors in this market space?
• What are the market opportunities and threats faced by the key vendors?
• What are the strengths and weaknesses of the key vendors?
You can request one free hour of our analyst’s time when you
purchase this market report. Details are provided within the report.
Make an enquiry before buying this
Report @ https://www.wiseguyreports.com/enquiry/417240/global-scanning-electron-microscope-market-2016-2020
Table of Content
PART 01: Executive summary
• Highlights
PART 02: Scope of the report
• Definitions
• Market size calculation
• Base year
• Geographical segmentation
• Vendor segmentation
• Top-vendor offerings
PART 03: Market research methodology
• Research methodology
• Economic indicators
PART 04: Introduction
• Key market highlights
PART 05: Market landscape
• Market overview
• Sample holders
• Wafer inspection equipment
• Market size and forecast
• Five forces analysis
PART 06: Market segmentation by end-user
• Semiconductors
• Life sciences
• Materials science
• Nanotechnology
PART 07: Geographical segmentation
• APAC
• Americas
• EMEA
PART 08: Market drivers
• Root-cause failure analysis
• Increased demand for FEG SEMs
• Growing nanotechnology research
PART 09: Impact of drivers
PART 10: Market challenges
• High product cost
• Long lead time
• Limitations of SEMs
• Long replacement cycles
PART 11: Impact of drivers and challenges
PART 12: Market trends
• Increased demand for low-voltage electron microscopes (LVEMs)
• Miniaturization of electronic devices
• Increased adoption in automobile sector
PART 13: Vendor landscape
• Competitive scenario
• Vendor analysis
• Other prominent vendors
PART 14: Appendix
• List of abbreviations
PART 15: Explore Technavio
• Highlights
PART 02: Scope of the report
• Definitions
• Market size calculation
• Base year
• Geographical segmentation
• Vendor segmentation
• Top-vendor offerings
PART 03: Market research methodology
• Research methodology
• Economic indicators
PART 04: Introduction
• Key market highlights
PART 05: Market landscape
• Market overview
• Sample holders
• Wafer inspection equipment
• Market size and forecast
• Five forces analysis
PART 06: Market segmentation by end-user
• Semiconductors
• Life sciences
• Materials science
• Nanotechnology
PART 07: Geographical segmentation
• APAC
• Americas
• EMEA
PART 08: Market drivers
• Root-cause failure analysis
• Increased demand for FEG SEMs
• Growing nanotechnology research
PART 09: Impact of drivers
PART 10: Market challenges
• High product cost
• Long lead time
• Limitations of SEMs
• Long replacement cycles
PART 11: Impact of drivers and challenges
PART 12: Market trends
• Increased demand for low-voltage electron microscopes (LVEMs)
• Miniaturization of electronic devices
• Increased adoption in automobile sector
PART 13: Vendor landscape
• Competitive scenario
• Vendor analysis
• Other prominent vendors
PART 14: Appendix
• List of abbreviations
PART 15: Explore Technavio
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